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1

[IEEE 2011 Symposium on Piezoelectricity, Acoustic Waves, and Device Applications (SPAWDA 2011) - Shenzhen, China (2011.12.9-2011.12.11)] 2011 Symposium on Piezoelectricity, Acoustic Waves and Device Applications (SPAWDA) - An innovative ultrasonic motor model for efficiency improvement

Chakradhar, Bezawada, Prudhvi, Potuganti, Sudarshan, Adapa, Raguveer, Peri

Year:

2011

Language:

english

File:

PDF, 461 KB

english, 2011

2

Characterization of Etched and Grown GaN-GaN Schottky Diodes

Peri, Prudhvi, Fu, Kai, Zhao, Yuji, Smith, David J.

Journal:

Microscopy and Microanalysis

Year:

2019

Language:

english

File:

PDF, 792 KB

english, 2019

3

Reverse Leakage Analysis for As-grown and Regrown Vertical GaN-on-GaN Schottky Barrier Diodes

Fu, Kai, Zhou, Jingan, Deng, Xuguang, Qi, Xin, Smith, David J., Goodnick, Stephen M., Zhao, Yuji, Fu, Houqiang, Huang, Xuanqi, Yang, Tsung-Han, Cheng, Chi-Yin, Peri, Prudhvi Ram, Chen, Hong, Montes, J

Journal:

IEEE Journal of the Electron Devices Society

Year:

2020

Language:

english

File:

PDF, 8.44 MB

english, 2020

4

Effects of growth temperature on electrical properties of GaN/AlN based resonant tunneling diodes with peak current density up to 1.01 MA/cm 2

Cornuelle, Evan M., Growden, Tyler A., Storm, David F., Brown, Elliott R., Zhang, Weidong, Downey, Brian P., Gokhale, Vikrant, Ruppalt, Laura B., Champlain, James G., Peri, Prudhvi, McCartney, Martha

Journal:

Year:

2020

File:

PDF, 3.89 MB

2020

5

Dependence of growth temperature on the electrical properties and microstructure of MBE-grown AlN/GaN resonant tunneling diodes on sapphire

Storm, David F., Growden, Tyler A., Cornuelle, Evan M., Peri, Prudhvi R., Osadchy, Thomas, Daulton, Jeffrey W., Zhang, Wei-Dong, Katzer, D. Scott, Hardy, Matthew T., Nepal, Neeraj, Molnar, Richard, Br

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2020

File:

PDF, 2.94 MB

2020

6

Plasma Enhanced Atomic Layer-etched and Regrown GaN-on-GaN High Power p-n Diodes

Ram peri, Prudhvi, Hatch, Kevin, Messina, Daniel, Fu, Kai, Zhao, Yuji, Nemanich, Robert, Smith, David

Journal:

Microscopy and Microanalysis

Year:

2020

File:

PDF, 820 KB

2020

7

Structural breakdown in high power GaN-on-GaN p-n diode devices stressed to failure

Peri, Prudhvi, Fu, Kai, Fu, Houqiang, Zhao, Yuji, Smith, David J.

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

2020

File:

PDF, 3.36 MB

2020